Investigation of ion – soft matter interactions for improving correlative microscopy techniques

SCHEME: CORE

CALL: 2012

DOMAIN: MS - New Functional and Intelligent Materials and Surfaces

FIRST NAME: Patrick

LAST NAME: Philipp

INDUSTRY PARTNERSHIP / PPP: No

INDUSTRY / PPP PARTNER:

HOST INSTITUTION: LIST

KEYWORDS: SIMS, particle-surface interactions, sputtering, radiation damage, fragmentation, swelling, roughening, numerical simulations, molecular dynamics simulations, correlative microscopy

START: 2013-07-01

END: 2016-06-30

WEBSITE: https://www.list.lu/

Submitted Abstract

Soft matter is omnipresent in materials science and life sciences. As such it is a primary field of application for 2D and 3D chemical imaging. Numerous analysis techniques allow for the characterization of such samples, however most techniques are either excellent for lateral resolution or chemical information. Combining two techniques with complementary advantages allows to merge these advantages and combine structural and chemical information. This concept is named correlative microscopy and has been applied to development of the PIES, He-SIMS and SIMS-SPM techniques at the UIS unit at the SAM department of CRP – Gabriel Lippmann. Characterization of soft matter samples by these techniques needs however a fundamental background in ion-surface interactions for the design of the instrumentation as well as the interpretation of the data. For dynamic SIMS used by the abovementioned techniques, most studies have been carried out for inorganic matter and so some fundamental background is still missing, including atomic mixing, preferential sputtering, swelling and roughness formation. The objective of the ICORM project is to investigate ion-matter interactions in soft matter for the experimental conditions used in the aforementioned techniques. Experimental techniques will be combined with numerical simulations. Experimental techniques will use Ga and rare gas ion beams for irradiation. Characterization of damage formation and roughening of the sputtered areas will be carried out by TEM, SEM and SPM. For most techniques, characterization will be in situ or sample transfer will be carried out under UHV conditions. Additional information on atomic scale mechanisms related to sputtering, atomic mixing, swelling and roughening will be obtained by MD simulations and simulations make use of the binary collision approximation. The simulations will be carried out in collaboration with the group of John Kieffer at the University of Michigan.

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